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Testability Concepts for Digital ICs: The Macro, Beenker, Bennetts, Thijssen-,

Description: Book Details Title: Testability Concepts for Digital ICs: The Macro Test Approach (F Item Condition: New Author: Frans Beenker, Roger Bennetts, A.P. Thijssen ISBN 10: 0792396588 Publisher: Springer ISBN 13: 9780792396581 Published On: 1995-11-30 SKU: 4444-ING-9780792396581 Binding: Hardcover Language: english Edition: 1995 List Price: - At AwesomeBooks we believe that good quality and speed of service is what pleases our customers and according to this we have a product guarantee on all our books. All used books sold by AwesomeBooks: Will be clean, not soiled or stained. All pages will be present and undamaged. Books will be free of page markings. Some pages may be slightly dog-eared through previous use. The spine may show some creasing through previous use. Ultimately we would never send any book we would not pick up and read ourselves. All new books sold by AwesomeBooks: Will be completely new, sourced from the publisher. Wrapped carefully to prevent damage or curling of book edges. 100% money back guarantee If you are not satisfied for any reason, simply drop us an email and we will give you a 100% refund upon returning the item. If you are not happy then neither are we. If your order has not be reached you within a maximum of 21 days please contact us and we will respond immediately to help. Return Policy At AwesomeBooks, we believe our customers should feel free to order any of our products in the knowledge that they can return anything back within 30 days of purchasing an item for any reason. We will not make it awkward, if you want to return something then all you have to do is ask! Simply drop us an email to the address given on your order confirmation email or login to your paypal account used for payment and send us an email from there. For defects or problems caused before receipt of an item we will of course provide full instructions on how to return the item to us. For other issues (perhaps you did not like a product or it did not live up to expectations), we are happy to refund all costs but require the buyer to pay the return postage cost. Once you drop us an email requesting a return, we will let you know the precise return method quickly and conveniently.

Price: 302.67 USD

Location: MD

End Time: 2025-01-22T07:06:13.000Z

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Testability Concepts for Digital ICs: The Macro, Beenker, Bennetts, Thijssen-,

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Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

Return policy details:

PublishedOn: 1995-11-30

Title: Testability Concepts for Digital ICs: The Macro Test Approach (F

Artist: Not Specified

Number of Pages: IX, 212 Pages

Publication Name: Testability concepts for Digital Ics : the Macro Test Approach

Language: English

Publisher: Springer

Subject: Industries / Retailing, Electronics / Circuits / Integrated, Electronics / Circuits / General, Electrical

Publication Year: 1995

Type: Textbook

Item Weight: 38.8 Oz

Subject Area: Technology & Engineering, Business & Economics

Author: F. P. Beenker, A. P. Thijssen, R. G. Bennetts

Item Length: 9.6 in

Item Width: 6.7 in

Series: Frontiers in Electronic Testing Ser.

Format: Hardcover

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