Description: Bargainbookstores Test-Driven Development for Embedded C (Paperback or Softback) By Grenning, James W. Condition: Format: Paperback or Softback Publisher: Pragmatic Bookshelf Publication Date: 5/5/2011 ISBN: 9781934356623 About Us Payment Shipping Terms Returns Welcome to BargainBookStores Your source for quality books at reduced prices. Satisfaction guaranteed! We guarantee your satisfaction and stand behind everything we sell. Standard shipping is always free to the lower 48 states. Expedited and International shipping options are also available. Thank you for your business and enjoy! Payments Payment for all eBay orders must be completed through eBay Payments. We require immediate payment for "Buy It Now" and "auction" style listings. Shipping We ship within the 48 contiguous United States. Tracking is provided for all US domestic shipments. Free Standard Shipping Most orders are processed within 2-5 business days of order receipt. Allow 1-5 business days for delivery after your order has shipped. Shipping times are estimated and are not guaranteed by Bargainbookstores Terms Item Availability While we try to maintain accurate quantity in our listing, items listed on eBay may be sold elsewhere before the eBay listing ends. If you bought an out of stock item, we will cancel your order and issue a refund. Please do not leave negative or neutral feedback for cancelled orders. Condition Guide Unless otherwise noted, all products sold by Bargainbookstores are brand new in retail packaging and include U.S. manufacturer warranty. 100% Customer Satisfaction Guaranteed We want to ensure your satisfaction. If you are dissatisfied with your purchase or shopping experience, we would like to hear from you. Please contact us using eBay Messaging . Please be sure to include your contact information and order number. Please note: Business hours are Monday-Friday. We try our best to respond to all questions and comments within one business day. Lost or Damaged Shipments If your order was damaged during shipping or if you did not receive your order, contact us and we will be happy to take care of the issue. Please wait until the end of the delivery time estimate before contacting us about missing shipments. Please contact us using eBay Messaging . Please include your contact information and order number. Your Privacy Bargainbookstores does not sell or market customer information to other businesses or organizations. Customer Comments We are constantly striving to improve our service and would love to hear your comments. Please contact us using eBay Messaging Returns Bargainbookstores accepts returns within 30 days of order receipt. Return Process Please contact us using eBay Messaging before returning your order. Returns without prior authorization will not be refunded. Return Requirements Returned merchandise must be in the same condition in which it was received. No return credit will be given if an item is in used condition or has missing or damaged retail packaging. Please adequately package return shipments. No credit will be given if item is damaged in return shipment.
Price: 25.05 USD
Location: Grand Rapids, Michigan
End Time: 2024-11-08T09:44:00.000Z
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Return shipping will be paid by: Seller
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
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EAN: 9781934356623
ISBN: 193435662X
Binding: TP
Book Title: Test-Driven Development for Embedded C
Number of Pages: 310 Pages
Language: English
Publication Name: Test Driven Development for Embedded C
Publisher: Pragmatic Programmers, LLC, T.H.E.
Item Height: 0.9 in
Subject: Software Development & Engineering / Quality Assurance & Testing, Software Development & Engineering / General, Programming Languages / C
Publication Year: 2011
Item Weight: 24.6 Oz
Type: Textbook
Subject Area: Computers
Item Length: 9.3 in
Author: James W. Grenning
Item Width: 7.4 in
Format: Trade Paperback
