SEM Test Calibration Sample - FEI Part 4022 262 37681 System Test

Description: Brand new, never used, FEI system test sample. Part # 4022 262 37681 (has been replaced with 4035 273 15051). $3400 from FEI (now Thermo Fisher Scientific). Contains a wide variety of samples for system verification.

Price: 2200 USD

Location: Los Angeles, California

End Time: 2024-09-25T16:51:22.000Z

Shipping Cost: 0 USD

Product Images

SEM Test Calibration Sample - FEI Part 4022 262 37681 System Test

Item Specifics

All returns accepted: ReturnsNotAccepted

Brand: FEI

Microscope Type: Scanning Electron Microscope (SEM)

MPN: 402226237681

SEM Test Calibration Sample - FEI Part 4022 262 37681 System Test

Product Images

Item Specifics

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