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Location: Cave Creek, Arizona
End Time: 2024-09-27T18:47:48.000Z
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All returns accepted: ReturnsNotAccepted
Edition: 4
Book Title: Scanning Electron Microscopy and X-Ray Microanalysis
Number of Pages: Xxiii, 550 Pages
Language: English
Publisher: Springer New York
Topic: Materials Science / General, Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Microscopes & Microscopy
Publication Year: 2017
Illustrator: Yes
Genre: Technology & Engineering, Science
Item Weight: 481.9 Oz
Item Length: 11 in
Author: Dale E. Newbury, John Henry J. Scott, Nicholas W. M. Ritchie, David C. Joy, Joseph I. Goldstein
Item Width: 8.3 in
Format: Hardcover
