Description: Integrated Circuit Defect-Sensitivity: Theory and Computational Models by José Pineda de Gyvez Estimated delivery 3-12 business days Format Hardcover Condition Brand New Description The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASICs). Publisher Description Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behaviour of the IC becomes crucial. This work reviews the importance of a defect-sensitivity analysis in contemporary VLSI design processes. The modelling of defects in microelectronics technologies is revised from a set theoretical approach as well as from a practical point of view. This way of handling the material introduces the reader step by step to critical area analysis through the construction of formal mathematical models. The rigorous formalism developed in the book is necessary to study the construction of deterministic algorithms for layout defect exploration. Without this basis, it would be impossible to scan layouts in the order of 1,000,000 objects, or more, in a reasonable time. The theoretical component of this book is complemented with a set of practical case studies for fault extraction, yield prediction and IC defect-sensitivity evaluation.These case studies emphasize the fact that by suing appropriate formulae combining statistical data with the computed defect-sensitivity, an estimate of the ICs defect tolerance can be obtained at the end of the respective production line. The case studies include a vast range of illustrations depicting critical areas. Examples range from highlighting their geometical nature as a function of the defect size to more specific situations highlighting layout regions where faults may occur. In addition to the visualization of critical areas, numerical data in the form of tables, graphs and histograms are provided for quantification purposes. More than that, ever smarter, defect-tolerant design strategies have to be devised to attain high yields. Obviously, the work presented in the book is not definitive, and more research will always be useful to advance the field of CAD for manufacturability. This is, of course, one of the challenges imposed by the ever-changing nature of microelectronic technologies. CAD developers and yield practitioners from academia and industry should find that this book lays the foundations for further pioneering work. Details ISBN 0792393066 ISBN-13 9780792393061 Title Integrated Circuit Defect-Sensitivity: Theory and Computational Models Author José Pineda de Gyvez Format Hardcover Year 1992 Pages 167 Edition 1993rd Publisher Springer GE_Item_ID:158891178; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
Price: 125.87 USD
Location: Fairfield, Ohio
End Time: 2024-12-21T03:03:15.000Z
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ISBN-13: 9780792393061
Book Title: Integrated Circuit Defect-Sensitivity: Theory and Computational M
Number of Pages: Xxiv, 167 Pages
Publication Name: Integrated Circuit Defect-Sensitivity : Theory and Computational Models
Language: English
Publisher: Springer
Publication Year: 1992
Subject: Electronics / Circuits / Vlsi & Ulsi, Cad-Cam, Electrical
Item Weight: 35.3 Oz
Type: Textbook
Author: José Pineda De Gyvez
Subject Area: Computers, Technology & Engineering
Item Length: 9.3 in
Series: The Springer International Series in Engineering and Computer Science Ser.
Item Width: 6.1 in
Format: Hardcover