Description: Integrated Circuit Defect-Sensitivity: Theory and Computational Models by José Pineda de Gyvez Estimated delivery 3-12 business days Format Paperback Condition Brand New Description The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASICs). Publisher Description The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASICs). Those fabrication plants would be concentrated with only a few market leaders. Details ISBN 1461363837 ISBN-13 9781461363835 Title Integrated Circuit Defect-Sensitivity: Theory and Computational Models Author José Pineda de Gyvez Format Paperback Year 2014 Pages 167 Publisher Springer-Verlag New York Inc. GE_Item_ID:137857426; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
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End Time: 2024-12-24T03:52:13.000Z
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ISBN-13: 9781461363835
Book Title: Integrated Circuit Defect-Sensitivity: Theory and Computational M
Number of Pages: Xxiv, 167 Pages
Publication Name: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Language: English
Publisher: Springer
Subject: Electronics / Circuits / Vlsi & Ulsi, Electrical
Publication Year: 2014
Type: Textbook
Item Weight: 10.9 Oz
Item Length: 9.3 in
Subject Area: Technology & Engineering
Author: José Pineda De Gyvez
Series: The Springer International Series in Engineering and Computer Science Ser.
Item Width: 6.1 in
Format: Trade Paperback