EXAFS Spectroscopy: Techniques and Applications by D.C. Joy (English) Paperback

Description: EXAFS Spectroscopy by D.C. Joy, B.K. Teo This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. FORMAT Paperback LANGUAGE English CONDITION Brand New Publisher Description This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant. Table of Contents 1 Historical Development of EXAFS.- 2 Theory of Extended X-Ray Absorption Fine Structure.- 3 EXAFS Spectroscopy: Techniques and Applications.- 4 Understanding the Causes of Non-Transferability of EXAFS Amplitude.- 5 Near Neighbor Peak Shape Considerations in EXAFS Analysis.- 6 Disorder Effects in the EXAFS of Metals and Semiconductors in the Solid and Liquid States.- 7 Structural Studies of Supertonic Conduction.- 8 Extended X-Ray Absorption Fine Structure Studies at High Pressure.- 9 Structural Evidence for Solutions from EXAFS Measurements.- 10 EXAFS Studies of Supported Metal Catalysts.- 11 EXAFS of Amorphous Materials.- 12 EXAFS of Dilute Systems: Fluorescence Detection.- 13 EXAFS Studies of Dilute Impurities in Solids.- 14 Materials Research at Stanford Synchrotron Radiation Laboratory.- 15 Cornell High Energy Synchrotron Source: CHESS.- 16 National Synchrotron Light Source (NSLS): An Optimized Source for Synchrotron Radiation.- 17 Electron Energy Loss Spectroscopy for Extended Fine Structure Studies — An Introduction.- 18 Extended Core Edge Fine Structure in Electron Energy Loss Spectra.- 19 Extended Energy Loss Fine Structure Studies in an Electron Microscope.- 20 A Comparison of Electron and Photon Beams for Obtaining Inner Shell Spectra.- 21 Some Thoughts Concerning the Radiation Damage Resulting from Measurement of Inner Shell Excitation Spectra Using Electron and Photon Beams. Promotional Springer Book Archives Long Description This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant. Details ISBN1475712405 ISBN-10 1475712405 ISBN-13 9781475712407 Format Paperback Author B.K. Teo Imprint Springer-Verlag New York Inc. Subtitle Techniques and Applications Place of Publication New York, NY Country of Publication United States DEWEY 543.08586 Birth 1943 Year 2012 Publication Date 2012-10-29 Short Title EXAFS SPECTROSCOPY SOFTCOVER R Language English Media Book Pages 275 Illustrations 50 Illustrations, black and white; VIII, 275 p. 50 illus. DOI 10.1007/978-1-4757-1238-4 AU Release Date 2012-10-29 NZ Release Date 2012-10-29 US Release Date 2012-10-29 UK Release Date 2012-10-29 Publisher Springer-Verlag New York Inc. Edition Description Softcover reprint of the original 1st ed. 1981 Alternative 9780306406546 Audience Professional & Vocational We've got this At The Nile, if you're looking for it, we've got it. With fast shipping, low prices, friendly service and well over a million items - you're bound to find what you want, at a price you'll love! TheNile_Item_ID:96356970;

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