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Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scat

Description: Critical Phenomena at Surfaces and Interfaces by Helmut Dosch Estimated delivery 3-12 business days Format Paperback Condition Brand New Description This book deals with the application of grazing angle x-rayand neutron scattering to the study of surface-inducedcritical phenomena. Publisher Description This book deals with the application of grazing angle x-rayand neutron scattering to the study of surface-inducedcritical phenomena. With the advent of even more advancedsynchrotron radiation sources and new sophisticatedinstrumentation this novel technique is expected toexperience a boom.The comprehensive and detailed presentation of theoreticaland experimental aspects of the scattering of evanascentx-ray and neutron waves inside a solid makes this bookparticularly useful for tutorial courses.Particular emphasis is put on the use of this technique toextract microscopic information (correlation functions) fromthe real structure of a surface, from buried and magneticinterfaces and from surface roughness. Details ISBN 3662149753 ISBN-13 9783662149751 Title Critical Phenomena at Surfaces and Interfaces Author Helmut Dosch Format Paperback Year 2013 Pages 149 Publisher Springer-Verlag Berlin and Heidelberg GmbH & Co. KG GE_Item_ID:140620000; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys

Price: 66.85 USD

Location: Fairfield, Ohio

End Time: 2025-01-22T03:44:32.000Z

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Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scat

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Restocking Fee: No

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

ISBN-13: 9783662149751

Book Title: Critical Phenomena at Surfaces and Interfaces

Number of Pages: X, 149 Pages

Language: English

Publication Name: Critical Phenomena at Surfaces and Interfaces : Evanescent X-Ray and Neutron Scattering

Publisher: Springer Berlin / Heidelberg

Publication Year: 2013

Item Height: 0.1 in

Subject: Lasers & Photonics, Physics / Optics & Light, Radiation, Chemistry / Physical & Theoretical, Physics / Nuclear, Physics / General

Type: Textbook

Item Weight: 9 Oz

Author: Helmut Dosch

Subject Area: Technology & Engineering, Science

Item Length: 9.3 in

Series: Springer Tracts in Modern Physics Ser.

Item Width: 6.1 in

Format: Trade Paperback

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