Description: This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
Price: 125 USD
Location: Matraville, NSW
End Time: 2025-02-05T19:11:26.000Z
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Item Specifics
Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 60 Days
Refund will be given as: Money Back
EAN: 9781856175173
UPC: 9781856175173
ISBN: 9781856175173
MPN: N/A
Item Height: 1.8 cm
Item Weight: 0.47 kg
Number of Pages: 304 Pages
Language: English
Publication Name: Atomic Force Microscopy in Process Engineering : An Introduction to AFM for Improved Processes and Products
Publisher: Elsevier Science & Technology
Subject: Industrial Engineering, Electron Microscopes & Microscopy, Chemical & Biochemical
Publication Year: 2009
Type: Textbook
Author: Nidal Hilal, W. Richard Bowen
Item Length: 9 in
Subject Area: Technology & Engineering, Science
Item Width: 6 in
Format: Hardcover
